Journal: ACS Omega

Article Title: Fabrication and Characterization of CdTe Thin Films: Insights into Classical and Cryogenic Fabrication Techniques

doi: 10.1021/acsomega.4c07171

Figure Lengend Snippet: Schematic representation of (a) classical technique apparatus and (b) cryogenic technique apparatus for the CdTe thin film production.

Article Snippet: Powder X-ray diffraction (PXRD) analyses for determining the crystal structure of the CdTe thin films were performed using a Panalytical Empyrean device with Cu Kα (λ = 1.5408 Å) radiation for a 2θ coupled mode in a range of 10–80° with a step size of 0.02°.

Techniques:

Journal: ACS Omega

Article Title: Fabrication and Characterization of CdTe Thin Films: Insights into Classical and Cryogenic Fabrication Techniques

doi: 10.1021/acsomega.4c07171

Figure Lengend Snippet: PXRD patterns of CdTe thin films at different substrate temperatures.

Article Snippet: Powder X-ray diffraction (PXRD) analyses for determining the crystal structure of the CdTe thin films were performed using a Panalytical Empyrean device with Cu Kα (λ = 1.5408 Å) radiation for a 2θ coupled mode in a range of 10–80° with a step size of 0.02°.

Techniques:

Journal: ACS Omega

Article Title: Fabrication and Characterization of CdTe Thin Films: Insights into Classical and Cryogenic Fabrication Techniques

doi: 10.1021/acsomega.4c07171

Figure Lengend Snippet: FESEM images of CdTe thin films produced on the glass substrate at different substrate temperatures (a) 573, (b) 473, (c) 373, (d) 300, (e) 200, and (f) 100 K

Article Snippet: Powder X-ray diffraction (PXRD) analyses for determining the crystal structure of the CdTe thin films were performed using a Panalytical Empyrean device with Cu Kα (λ = 1.5408 Å) radiation for a 2θ coupled mode in a range of 10–80° with a step size of 0.02°.

Techniques: Produced

Journal: ACS Omega

Article Title: Fabrication and Characterization of CdTe Thin Films: Insights into Classical and Cryogenic Fabrication Techniques

doi: 10.1021/acsomega.4c07171

Figure Lengend Snippet: Variation of particle size and void density values of CdTe thin films depends on different substrate temperatures.

Article Snippet: Powder X-ray diffraction (PXRD) analyses for determining the crystal structure of the CdTe thin films were performed using a Panalytical Empyrean device with Cu Kα (λ = 1.5408 Å) radiation for a 2θ coupled mode in a range of 10–80° with a step size of 0.02°.

Techniques:

Journal: ACS Omega

Article Title: Fabrication and Characterization of CdTe Thin Films: Insights into Classical and Cryogenic Fabrication Techniques

doi: 10.1021/acsomega.4c07171

Figure Lengend Snippet: Three-dimensional (3D) AFM image plot of CdTe thin films produced on the surface of glass substrates at different substrate temperatures. (a) 573 K, (b) 473, (c) 373, (d) 300, (e) 200, and (f) 100 K substrate temperature.

Article Snippet: Powder X-ray diffraction (PXRD) analyses for determining the crystal structure of the CdTe thin films were performed using a Panalytical Empyrean device with Cu Kα (λ = 1.5408 Å) radiation for a 2θ coupled mode in a range of 10–80° with a step size of 0.02°.

Techniques: Produced

Journal: ACS Omega

Article Title: Fabrication and Characterization of CdTe Thin Films: Insights into Classical and Cryogenic Fabrication Techniques

doi: 10.1021/acsomega.4c07171

Figure Lengend Snippet: Average surface roughness ( R a ) plot of CdTe thin films produced on the surface of glass substrates at different substrate temperatures.

Article Snippet: Powder X-ray diffraction (PXRD) analyses for determining the crystal structure of the CdTe thin films were performed using a Panalytical Empyrean device with Cu Kα (λ = 1.5408 Å) radiation for a 2θ coupled mode in a range of 10–80° with a step size of 0.02°.

Techniques: Produced

Journal: ACS Omega

Article Title: Fabrication and Characterization of CdTe Thin Films: Insights into Classical and Cryogenic Fabrication Techniques

doi: 10.1021/acsomega.4c07171

Figure Lengend Snippet: Variation of (α h ν) 2 as a function of h ν for the CdTe thin films produced at different substrate temperatures.

Article Snippet: Powder X-ray diffraction (PXRD) analyses for determining the crystal structure of the CdTe thin films were performed using a Panalytical Empyrean device with Cu Kα (λ = 1.5408 Å) radiation for a 2θ coupled mode in a range of 10–80° with a step size of 0.02°.

Techniques: Produced

Journal: ACS Omega

Article Title: Fabrication and Characterization of CdTe Thin Films: Insights into Classical and Cryogenic Fabrication Techniques

doi: 10.1021/acsomega.4c07171

Figure Lengend Snippet: Parameters Calculated from the X-ray Diffraction Patterns of CdTe Films Produced on Glass at Different Substrate Temperatures

Article Snippet: Powder X-ray diffraction (PXRD) analyses for determining the crystal structure of the CdTe thin films were performed using a Panalytical Empyrean device with Cu Kα (λ = 1.5408 Å) radiation for a 2θ coupled mode in a range of 10–80° with a step size of 0.02°.

Techniques: X-ray Diffraction, Produced

Journal: ACS Omega

Article Title: Fabrication and Characterization of CdTe Thin Films: Insights into Classical and Cryogenic Fabrication Techniques

doi: 10.1021/acsomega.4c07171

Figure Lengend Snippet: Energy Band Gap ( E g ), Carrier Density (η), and Resistivity (ρ) Values of CdTe Thin Films Produced at Different Substrate Temperatures

Article Snippet: Powder X-ray diffraction (PXRD) analyses for determining the crystal structure of the CdTe thin films were performed using a Panalytical Empyrean device with Cu Kα (λ = 1.5408 Å) radiation for a 2θ coupled mode in a range of 10–80° with a step size of 0.02°.

Techniques: Produced